8. Two-Dimensional Topological Insulators with Millimetre-Scale Uniformity, W. Lee, Q. Gao, Y. Zhao, H. Li, A. Tsui, Y. Zhang, Y. Bai, H. Lin, K. D. Nguyen, G. Berruto, G. Yan, J. Dang, T. Wu, H. Rokni, T. Marchese, Y. S. Meng, C.-X. Liu, X.-X. Zhang, C. Liu, P. Y. Huang, M. C. Hersam, B. Yan, S.-L. Yang, in review (2025)

7. Electronic ordering driven by flat band nesting in van der Waals magnet Fe5GeTe2. Q. Gao, G. Berruto, K. D. Nguyen, C. Hu, H. Lin, B. Goh, B. G. Jang, X. Xu, P. Littlewood, J.-H. Chu, S.-L. Yang, arXiv:2508.03116 in review (2025)
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6. A Topological Superconductor Tuned by Electronic Correlations. H. Lin , C. Jacobs , C. Yan , G. Nolan , P. Singleton , Y. Bai , Q. Gao , G. Berruto , K. D. Nguyen , X. Wu , C.-X. Liu , N. Guisinger , P. Huang , S. Mandal, S.-L. Yang, arXiv:2503.22888 in review (2025)

5. Spectroscopic evidence of intra-unit-cell charge redistribution in a charge-neutral magnetic topological insulator. K. D. Nguyen, G. Berruto, S. H. Lee, Y. Bai, H. Lin, Q, Gao, Z.-Q. Mao, S.-L. Yang, Nanoscale 17, 10663-10669 (2025)

4. Distinguishing Surface and Bulk Electromagnetism via Their Dynamics in an Intrinsic Magnetic Topological Insulator, K. D. Nguyen, W. Lee, J. Dang, T. Wu, G. Berruto, C. Yan, C. I. Ip, H. Lin, Q. Gao, S. H. Lee, B. Yan, C-X. Liu, Z. Mao, X.-X. Zhang, S.-L. Yang, Science Advances 10, aedn5696 (2024) or arXiv for the typo-free version. UChicago News

3. Common anion rule in oxide heterointerfaces: Experimental verification by in situ photoemission spectroscopy, R. Hayasaka, T. Kanda, Y. Masutake, K. D. Nguyen, N. Hasegawa, S. Inoue, A. Wada, M. Kitamura, D. Shiga, K. Yoshimatsu, H. Kumigashira, APL Materials 12, 071111 (2024)

2. Preservation of Topological Surface States in Millimeter-Scale Transferred Membranes, C. I. Ip, Q. Gao, K. D. Nguyen, C. Yan, G. Yan, T. Marchese, M. Zhang, W. Lee, H. Rokni, S. Y. Meng, C. Liu, S.-L. Yang, Nano Letters 24, 25, 7557–7563 (2024)

1. Electronic structure of SrTi1-xVxO3 films studied by in situ photoemission spectroscopy: Screening for a transparent electrode material, T. Kanda, D. Shiga, R. Yukawa, N. Hasegawa, D. K. Nguyen, X. Cheng, R. Tokunaga, M. Kitamura, K. Horiba, K. Yoshimatsu, H. Kumigashira, Physical Review B 104, 115121 (2021)